/ Structures

Trace Analysis and Imaging Laboratory (TAIL)

TAIL is an analytical platform of UC aiming to provide support for all R&D activities that require detailed trace (sub ppm) information about elemental composition, complemented with high-resolution imaging and/or measurement of physical properties.

5 available services

Imaging by Electron Scanning Microscopy (SEM)

Imaging by Electron Scanning Microscopy (SEM)

Measurement of the thickness of thin films by X-ray fluorescence (XRF)

Measurement of the thickness of thin films and coatings by X-ray fluorescence (XRF)

Powder X-ray diffraction (XRD) at room temperature

Obtenção de imagem por microscopia de força atómica (AFM)

Powder X-ray diffraction (XRD) at room temperature (XRD)

Aquisição de perfis de refletometria de RX (XRR) para caracterização de filmes finos e revestimentos (espessura do filme, rugosidade, etc.)

X-ray Fluorescence Analysis (XRF) via Energy Disersive Spectroscopy EDS

Obtenção de espectros de fluorescência de raios-X por excitação de feixe eletrónico (espectroscopia EDS)