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Measurement of the thickness of thin films by X-ray fluorescence (XRF)

Measurement of the thickness of thin films and coatings by X-ray fluorescence (XRF)

The measurement is performed on a Hitachi EA6000VX XRF instrument, icapable of coating thickness measurements,including coating thickness measurement of ultra-thin Au films. Analysis of hazardous substances such as Pb in plating can be measured simultaneously with coating thickness measurements. For example, possibilities include composition measurement of hazardous substances in Pb-free solder plating, Sn plating of lead frames, and electroless Ni plating.

Technique:
  • X-ray fluorescence spectroscopy (XRF)
Method:XRF, X-ray Fluorescence Spectroscopy
Products:
  • Coatings
  • Thin films
Access types
  • Físico
  • Enviado por correio
Access modes
  • Paid
  • Free Conditionally
Geographical availability
  • World
Languages
  • Inglês
  • Português
Service provided byTrace Analysis and Imaging Laboratory (TAIL)