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Powder X-ray diffraction (XRD) at room temperature

Obtenção de imagem por microscopia de força atómica (AFM)

The images are obtained in an AFM/STM insrument can perform STM and contact, non-contact and semicontact AFM, EFM, KPM, SCM, MFM, PFM and many other modes. It is equipped with in-plane and out of the plane magnetic field and sample heaters up to 300ºC. Both scanning by tip and scanning by sample available.The instrument is acoustically isolated and sits on top of an active anti-vibration table for low noise measurements.

Technique:
  • Atomic Force Microscopy
Method:AFM, Atomic Force Microscopy
Product:
  • Thin films
Access type
  • Físico
Access mode
  • Paid
Geographical availability
  • World
Languages
  • Inglês
  • Português
Tags:

Perguntas frequentes
José António Paixão

CFisUC

Pedro Sidónio Pereira da Silva

Universidade de Coimbra

Technician
Service provided byTrace Analysis and Imaging Laboratory (TAIL)