Powder X-ray diffraction (XRD) at room temperature (XRD)

Simultaneous measurement of thermal conductivity, resistivity and termopower (Seebeck coefficient) in the temperature range 1.8-400 K and applied magnetic field 0-9T.

Medição simultanea da condutividade térmica, resistividade elétrica e coeficiente de Seebeck (poder termoelétrico) na gama de temperaturas 1.8-400K e campo magnético 0-9T.

Specifications:

Thermal conductance

Sensitivity:

± 5 % ± 2 μW/K, whichever is greater, for T < 15 K
± 5 % or ± 20 μW/K, whichever is greater, for 15 K < T < 200 K

± 5 % or ± 0.5 mW/K, whichever is greater, for 200 K < T < 300 K
± 5 % or ± 1 mW/K, whichever is greater, for T > 300 K

Thermal Conductivity

Dynamic range:

1 to 25 mW/K for high T = 400 K 100 μW/K to 100 mW/K for T ≈ 50 K 10 μW/K to 1 mW/K for T ≈ 1.9 K

0.1 to 250 W/m∙K @ T = 300 K

Thermopower (Seebeck coefficient)

Error in S = ± 5 % or, Error in S = ± 0.5 μV/K or, Error in V = ± 2 μV, whichever is greatest
Dynamic range: 1 μV/K to 1 V/K

Resistivity

Precision: 0.01% for 1 Ω @ 200 μA

Dynamic range: 10 μΩ to 5 MΩ

Thermoelectric figure of merit (ZT)

Precision: ± 15 %

Speed of acquisition: ± 0.5 K/min, T > 20 K ± 0.2 K/min, T < 20 K